Hau-Riege, S: search on Z-Library

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1

An introduction to Cu electromigration

Christine S. Hau-Riege

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 561 KB

english, 2004

2

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL

Buck, J., Viefhaus, J., Scholz, F., Ilchen, M., Glaser, L., Özkan, C., Freund, W., Grünert, J., Molodtsov, S., Moeller, Stefan P., Yabashi, Makina, Hau-Riege, Stefan P.

Year:

2012

Language:

english

File:

PDF, 1.27 MB

english, 2012

3

Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

Chalupský, J., Juha, L., Hájková, V., Cihelka, J., Vyšín, L., Gautier, J., Hajdu, J., Hau-Riege, S. P., Jurek, M., Krzywinski, J.

Journal:

Year:

2009

Language:

english

File:

PDF, 290 KB

english, 2009

4

Microstructural evolution induced by scanned laser annealing in Al interconnects

Hau-Riege, C. S., Thompson, C. V.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 404 KB

english, 1999

5

Dual crystal x-ray spectrometer at 1.8 keV for high repetition-rate single-photon counting spectroscopy experiments

Gamboa, E.J., Bachmann, B., Kraus, D., MacDonald, M.J., Bucher, M., Carron, S., Coffee, R.N., Drake, R.P., Emig, J., Ferguson, K.R., Glenzer, S.H., Gorkhover, T., Hau-Riege, S.P., Krzywinski, J., Levi

Journal:

Journal of Instrumentation

Year:

2016

Language:

english

File:

PDF, 2.78 MB

english, 2016

6

[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Electromigration Reliability of Solder Balls

Hau-Riege, Christine, Yau, YouWen

Year:

2018

Language:

english

File:

PDF, 1.01 MB

english, 2018

7

Encapsulation and Diffraction-Pattern-Correction Methods to Reduce the Effect of Damage in X-Ray Diffraction Imaging of Single Biological Molecules

Hau-Riege, Stefan P., London, Richard A., Chapman, Henry N., Szoke, Abraham, Timneanu, Nicusor

Journal:

Physical Review Letters

Year:

2007

Language:

english

File:

PDF, 257 KB

english, 2007

8

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Investigation of via Bottom Barrier Integrity Impact on Electromigration

Aubel, O., Thierbach, S., Koschinsky, F., Feustel, F., Hau-Riege, C.S., Zistl, C.

Year:

2007

Language:

english

File:

PDF, 2.23 MB

english, 2007

9

[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Modeling and Design of SiC-based High-Frequency Photoconductive Switches

Rakheja, S., Huang, L., Hau-Riege, S., Harrison, S. E., Voss, L. F., Conway, A. M.

Year:

2020

File:

PDF, 472 KB

2020

10

Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser

Hau-Riege, Stefan P., London, Richard A., Bionta, Richard M., Soufli, Regina, Ryutov, Dmitri, Shirk, Michael, Baker, Sherry L., Smith, Patrick M., Nataraj, Pradeep

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 260 KB

english, 2008

11

Simulation of microstructural evolution induced by scanned laser annealing of metallic interconnects

C. S. Hau-Riege, S. P. Hau-Riege, C. V. Thompson

Journal:

Journal of Electronic Materials

Year:

2001

Language:

english

File:

PDF, 267 KB

english, 2001

12

X-ray image reconstruction from a diffraction pattern alone

Marchesini, S., He, H., Chapman, H. N., Hau-Riege, S. P., Noy, A., Howells, M. R., Weierstall, U., Spence, J. C. H.

Journal:

Physical Review B

Year:

2003

Language:

english

File:

PDF, 351 KB

english, 2003

13

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Contrasting failure characteristics of different levels of Cu dual-damascene metallization

Gan, C.L., Wei, F., Thompson, C.V., Pey, K.L., Choi, W.K., Hau-Riege, S.P., Yu, B.

Year:

2002

Language:

english

File:

PDF, 591 KB

english, 2002

14

Performance Modeling of Silicon Carbide Photoconductive Switches for High-Power and High-Frequency Applications

Rakheja, S., Huang, L., Hau-Riege, S., Harrison, S. E., Voss, L. F., Conway, A. M.

Journal:

IEEE Journal of the Electron Devices Society

Year:

2020

File:

PDF, 4.08 MB

2020

15

[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - A study of wafer level package board level reliability

Xu, Steven, Keser, Beth, Hau-Riege, Christine, Bezuk, Steve, Yau, You-Wen

Year:

2013

Language:

english

File:

PDF, 1.51 MB

english, 2013

16

Large-scale molecular dynamics simulations of dense plasmas: The Cimarron Project

Graziani, Frank R., Batista, Victor S., Benedict, Lorin X., Castor, John I., Chen, Hui, Chen, Sophia N., Fichtl, Chris A., Glosli, James N., Grabowski, Paul E., Graf, Alexander T., Hau-Riege, Stefan P

Journal:

High Energy Density Physics

Year:

2012

Language:

english

File:

PDF, 2.62 MB

english, 2012

17

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Design of an x-ray split- and delay-unit for the European XFEL

Roling, Sebastian, Samoylova, Liubov, Siemer, Björn, Sinn, Harald, Siewert, Frank, Wahlert, Frank, Wöstmann, Michael, Zacharias, Helmut, Moeller, Stefan P., Yabashi, Makina, Hau-Riege, Stefan P.

Year:

2012

Language:

english

File:

PDF, 1.32 MB

english, 2012

18

High-Intensity X-Rays - Interaction with Matter (Processes in Plasmas, Clusters, Molecules, and Solids) || Scattering of X-Ray Radiation

Hau-Riege, Stefan P.

Year:

2011

Language:

english

File:

PDF, 360 KB

english, 2011

19

Use of scanned laser annealing to control the bamboo grain length of Cu interconnects

Hau-Riege, C. S., Thompson, C. V.

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 259 KB

english, 2000

20

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || One-Photon Photoionization

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 248 KB

english, 2014

21

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV - Calibration results for first NIF Kirkpatrick-Baez microscope

Koch, Jeffrey A., Grim, Gary P., Brejnholt, Nicolai F., Ayers, Jay J., McCarville, Thomas J., Pardini, Tom, Pickworth, Louisa A., Bradley, David K., Decker, Todd A., Hau-Riege, Stefan P., Hill, Randal

Year:

2015

Language:

english

File:

PDF, 778 KB

english, 2015

22

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Emerging Lithographic Technologies VII - Defect repair for extreme-ultraviolet lithography (EUVL) mask blanks

Engelstad, Roxann L., Hau-Riege, Stefan P., Barty, Anton, Mirkarimi, Paul B., Stearns, Daniel G., Chapman, Henry N., Sweeney, Donald W., Clift, W. Miles, Gullikson, Eric, Yi, Moon-Suk

Year:

2003

Language:

english

File:

PDF, 252 KB

english, 2003

23

The linac coherent light source single particle imaging road map

Aquila, A., Barty, A., Bostedt, C., Boutet, S., Carini, G., dePonte, D., Drell, P., Doniach, S., Downing, K. H., Earnest, T., Elmlund, H., Elser, V., Gühr, M., Hajdu, J., Hastings, J., Hau-Riege, S. P

Journal:

Structural Dynamics

Year:

2015

Language:

english

File:

PDF, 143 KB

english, 2015

24

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || Harmonic Oscillator

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 69 KB

english, 2014

25

Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment

A.S. Budiman, P.R. Besser, C.S. Hau-Riege, A. Marathe, Y.-C. Joo, N. Tamura, J.R. Patel, W.D. Nix

Journal:

Journal of Electronic Materials

Year:

2009

Language:

english

File:

PDF, 773 KB

english, 2009

26

High-Intensity X-Rays - Interaction with Matter (Processes in Plasmas, Clusters, Molecules, and Solids) || Index

Hau-Riege, Stefan P.

Year:

2011

Language:

english

File:

PDF, 62 KB

english, 2011

27

[IEEE 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Lake Buena Vista, FL, USA (2011.05.31-2011.06.3)] 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Electromigration studies of lead-free solder balls used for wafer-level packaging

Hau-Riege, Christine, Zang, Ricky, Yau, You-Wen, Yadav, Praveen, Keser, Beth, Lin, Jong-Kai

Year:

2011

Language:

english

File:

PDF, 1.18 MB

english, 2011

28

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || Introduction

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 146 KB

english, 2014

29

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - The effect of a width transition on the electromigration reliability of Cu interconnects

Hau-Riege, Christine, Klein, Rich

Year:

2008

Language:

english

File:

PDF, 180 KB

english, 2008

30

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals

Caleman, Carl, Tîmneanu, Nicusor, Martin, Andrew V., White, Thomas A., Scott, Howard A., Barty, Anton, Aquila, Andrew, Chapman, Henry N., Moeller, Stefan P., Yabashi, Makina, Hau-Riege, Stefan P.

Year:

2012

Language:

english

File:

PDF, 491 KB

english, 2012

31

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - The experience of the FERMI@Elettra photon beam transport and diagnostics system (PADReS) during three years of continuous support of machine and user experiments: achievements, lessons learned, and future upgrades

Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Zangrando, Marco, Fava, Claudio, Gerusina, Simone, Gobessi, Riccardo, Mahne, Nicola, Mazzucco, Eric, Raimondi, Lorenzo, Rumiz, Luca, Svetina,

Year:

2014

Language:

english

File:

PDF, 945 KB

english, 2014

32

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Key metrics for the electromigration performance for solder and copper-based package interconnects

Hau-Riege, Christine, Yau, YouWen, Caffey, Kevin

Year:

2016

Language:

english

File:

PDF, 805 KB

english, 2016

33

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || Interaction of the Electromagnetic Field with Matter

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 96 KB

english, 2014

34

A new streaked soft x-ray imager for the National Ignition Facility

Benstead, J., Moore, A. S., Ahmed, M. F., Morton, J., Guymer, T. M., Soufli, R., Pardini, T., Hibbard, R. L., Bailey, C. G., Bell, P. M., Hau-Riege, S., Bedzyk, M., Shoup, M. J., Reagan, S., Agliata,

Journal:

Review of Scientific Instruments

Year:

2016

Language:

english

File:

PDF, 2.93 MB

english, 2016

35

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A study of self- and mutual-heating in wafer level packaging systems

Hau-Riege, Christine, Xu, Guoping, Zhang, Q J, Yau, YouWen, Farr, Hosain

Year:

2017

Language:

english

File:

PDF, 551 KB

english, 2017

36

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || Quantization of the Free Electromagnetic Field

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 25 KB

english, 2014

37

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) ||

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 2.72 MB

english, 2014

38

Nonrelativistic Quantum X-Ray Physics (hau-riege/Nonrelativistic Quantum X-Ray Physics) || Radiative Atomic Bound-Bound Transitions

Hau-Riege, Stefan P.

Year:

2014

Language:

english

File:

PDF, 148 KB

english, 2014

39

Ultrafast single-shot diffraction imaging of nanoscale dynamics

Barty, Anton, Boutet, Sébastien, Bogan, Michael J., Hau-Riege, Stefan, Marchesini, Stefano, Sokolowski-Tinten, Klaus, Stojanovic, Nikola, Tobey, Ra'anan, Ehrke, Henri, Cavalleri, Andrea

Journal:

Nature Photonics

Year:

2008

File:

PDF, 95 KB

2008

40

Photoelectron Dynamics in X-Ray Free-Electron-Laser Diffractive Imaging of Biological Samples

Hau-Riege, Stefan P.

Journal:

Physical Review Letters

Year:

2012

Language:

english

File:

PDF, 620 KB

english, 2012

41

Modeling of the damage dynamics of nanospheres exposed to x-ray free-electron-laser radiation

Hau-Riege, Stefan P., Chapman, Henry N.

Journal:

Physical Review E

Year:

2008

Language:

english

File:

PDF, 244 KB

english, 2008

42

High-Intensity X-Rays - Interaction with Matter (Processes in Plasmas, Clusters, Molecules, and Solids) || Atomic Physics

Hau-Riege, Stefan P.

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

43

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - The impact of different under bump metallurgies and redistribution layers on the electromigration of solder balls for wafer-level packaging

Hau-Riege, Christine, Keser, Beth, Alvarado, Rey, Syed, Ahmer, Yau, YouWen, Bezuk, Steve, Caffey, Kevin

Year:

2014

Language:

english

File:

PDF, 2.91 MB

english, 2014

44

User Workshop on High-Power Lasers at the Linac Coherent Light Source

Falcone, Roger, Glenzer, Siegfried, Hau-Riege, Stefan

Journal:

Synchrotron Radiation News

Year:

2014

Language:

english

File:

PDF, 892 KB

english, 2014

45

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - X-ray photon diagnostics devices for the European XFEL

Grünert, Jan, Buck, Jens, Ozkan, Cigdem, Freund, Wolfgang, Molodtsov, Serguei, Moeller, Stefan P., Yabashi, Makina, Hau-Riege, Stefan P.

Year:

2012

Language:

english

File:

PDF, 612 KB

english, 2012

46

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI

Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Finetti, P., Allaria, E., Diviacco, B., Callegari, C., Mahieu, B., Viefhaus, J., Zangrando, M., De Ninno, G., Lambert, G., Ferrari, E., Buck,

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

47

Effect of high-intensity x-ray radiation on Bragg diffraction in silicon and diamond

Hau-Riege, Stefan P., Pardini, Tommaso

Journal:

Journal of Applied Physics

Year:

2012

Language:

english

File:

PDF, 528 KB

english, 2012

48

Machine-Learning-Based Monitoring of Laser Powder Bed Fusion

Yuan, Bodi, Guss, Gabriel M., Wilson, Aaron C., Hau-Riege, Stefan P., DePond, Phillip J., McMains, Sara, Matthews, Manyalibo J., Giera, Brian

Journal:

Advanced Materials Technologies

Year:

2018

Language:

english

File:

PDF, 1.95 MB

english, 2018

49

Limitations of coherent diffractive imaging of single objects due to their damage by intense x-ray radiation

Ziaja, B, Chapman, H N, Fäustlin, R, Hau-Riege, S, Jurek, Z, Martin, A V, Toleikis, S, Wang, F, Weckert, E, Santra, R

Journal:

New Journal of Physics

Year:

2012

Language:

english

File:

PDF, 772 KB

english, 2012

50

Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter

Hau-Riege, Stefan P., Chapman, Henry N., Krzywinski, Jacek, Sobierajski, Ryszard, Bajt, Saša, London, Richard A., Bergh, Magnus, Caleman, Carl, Nietubyc, Robert, Juha, Libor, Kuba, Jaroslav, Spiller,

Journal:

Physical Review Letters

Year:

2007

Language:

english

File:

PDF, 460 KB

english, 2007

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